Byoung Hi Jung: search on Z-Library

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1

Dissolution of iron oxide using oxalic acid

Sung Oh Lee, Tam Tran, Byoung Hi Jung, Seong Jun Kim, Myong Jun Kim

Journal:

Hydrometallurgy

Year:

2007

Language:

english

File:

PDF, 640 KB

english, 2007

2

Use of chloride–hypochlorite leachants to recover gold from tailing

Kwang Soo Nam, Byoung Hi Jung, Jeon Woong An, Tae Jun Ha, Tam Tran, Myong Jun Kim

Journal:

International Journal of Mineral Processing

Year:

2008

Language:

english

File:

PDF, 664 KB

english, 2008

3

[IEEE 2011 International Conference on Microelectronic Test Structures (ICMTS) - Amsterdam, Netherlands (2011.04.4-2011.04.7)] 2011 IEEE ICMTS International Conference on Microelectronic Test Structures - Novel BJT test structure for high-performance matching characteristics in CMOS-based analog applications

Jung, Yi-Jung, Park, Byoung-Seok, Han, In-Shik, Kwon, Hyuk-Min, Park, Sang-Uk, Bok, Jung-Deuk, Chung, Yi-Sun, Lim, Min-Gyu, Lee, Jung-Hwan, Lee, Hi-Deok

Year:

2011

Language:

english

File:

PDF, 153 KB

english, 2011

4

Mechanical intestinal obstruction following laparoscopic inguinal hernia repair in a patient with abdominal cocoon syndrome

Park, Geon Hi, Lee, Byoung Chul, Hyun, Dong woo, Choi, Jung Bum, Park, Young Mok, Jung, Hyuk Jae, Jo, Hong Jae

Journal:

Journal of Surgical Case Reports

Year:

2019

File:

PDF, 428 KB

2019

5

Processing of high purity gold from scraps using diethylene glycol di-N-butyl ether (dibutyl carbitol)

Byoung Hi Jung, Yi Yong Park, Jeon Woong An, Seong Jun Kim, Tam Tran, Myong Jun Kim

Journal:

Hydrometallurgy

Year:

2009

Language:

english

File:

PDF, 436 KB

english, 2009

6

Effects of Fluorine on the NBTI Reliability and Low-Frequency Noise Characteristics of p-MOSFETs

Kwon, Sung-Kyu, Kwon, Hyuk-Min, Han, In-Shik, Jang, Jae-Hyung, Oh, Sun-Ho, Song, Hyeong-Sub, Park, Byoung-Seok, Chung, Yi-Sun, Lee, Jung-Hwan, Lee, Jung-Hwan, Kim, Si-Bum, Lee, Ga-won, Hi-Deok,

Journal:

IEEE Journal of the Electron Devices Society

Year:

2018

Language:

english

File:

PDF, 579 KB

english, 2018

7

A Novel BJT Structure Implemented Using CMOS Processes for High-Performance Analog Circuit Applications

Jung, Yi-Jung, Park, Byoung-Seok, Kwon, Hyuk-Min, Kwon, Sung-Kyu, Jang, Jae-Hyung, Kwak, Ho-Young, Chung, Yi-Sun, Lee, Jung-Hwan, Lee, Hi-Deok

Journal:

IEEE Transactions on Semiconductor Manufacturing

Year:

2012

Language:

english

File:

PDF, 9.06 MB

english, 2012

8

[IEEE 2010 International Workshop on Junction Technology (IWJT) - Shanghai, China (2010.05.10-2010.05.11)] 2010 International Workshop on Junction Technology Extended Abstracts - Study on palladium germanide on Ge-on-Si substrate for nanoscale Ge channel Schottky barrier MOSFETs

Oh, Se-Kyung, Zhang, Ying-Ying, Shin, Hong-Sik, Han, In-Shik, Kwon, Hyuk-Min, Park, Byoung-Soek, Park, Sang-Uk, Bok, Jung-Deuk, Lee, Ga-Won, Wang, Jin-Suk, Lee, Hi-Deok

Year:

2010

Language:

english

File:

PDF, 575 KB

english, 2010

9

Carrier transport mechanism in La-incorporated high-k dielectric/metal gate stack MOSFETs

Hyuk-Min Kwon, Won-Ho Choi, In-Shik Han, Min-Ki Na, Sang-Uk Park, Jung-Deuk Bok, Chang-Yong Kang, Byoung-Hun Lee, Raj Jammy, Hi-Deok Lee

Journal:

Microelectronic Engineering

Year:

2011

Language:

english

File:

PDF, 556 KB

english, 2011

10

Comparison of Multilayer Dielectric Thin Films for Future Metal–Insulator–Metal Capacitors: Al$_{2}$O$_{3}$/HfO$_{2}$/Al$_{2}$O$_{3}$ versus SiO$_{2}$/HfO$_{2}$/SiO$_{2}$

Park, Sang-Uk, Kwon, Hyuk-Min, Han, In-Shik, Jung, Yi-Jung, Kwak, Ho-Young, Choi, Woon-Il, Ha, Man-Lyun, Lee, Ju-Il, Kang, Chang-Yong, Lee, Byoung-Hun, Jammy, Raj, Lee, Hi-Deok

Journal:

Japanese Journal of Applied Physics

Year:

2011

Language:

english

File:

PDF, 572 KB

english, 2011

11

A 2.5-V 2.0-Gbyte/s 288-Mb packet-based DRAM with enhanced cell efficiency and noise immunity

Kye-Hyun Kyung, Hi-Choon Lee, Ki-Whan Song, Ho-Sung Song, Keewook Jung, Joon-Seo Moon, Byoung-Sul Kim, Sung-Burn Cho, Changhyun Kim, Soo-In Cho

Journal:

IEEE Journal of Solid-State Circuits

Year:

2001

Language:

english

File:

PDF, 336 KB

english, 2001

12

Tradeoff Between Hot Carrier and Negative Bias Temperature Degradations in High-Performance $\hbox{Si}_{1 - x}\hbox{Ge}_{x}$ pMOSFETs With High-$k$/Metal Gate Stacks

Choi, Won-Ho, Kang, Chang-Young, Oh, Jung-Woo, Lee, Byoung-Hun, Majhi, Prashant, Kwon, Hyuk-Min, Jammy, Raj, Lee, Ga-Won, Lee, Hi-Deok

Journal:

IEEE Electron Device Letters

Year:

2010

Language:

english

File:

PDF, 451 KB

english, 2010

13

Erratum: “Comparison of Multilayer Dielectric Thin Films for Future Metal–Insulator–Metal Capacitors: Al$_{2}$O$_{3}$/HfO$_{2}$/Al$_{2}$O$_{3}$ versus SiO$_{2}$/HfO$_{2}$/SiO$_{2}$”

Park, Sang-Uk, Kwon, Hyuk-Min, Han, In-Shik, Jung, Yi-Jung, Kwak, Ho-Young, Choi, Woon-Il, Ha, Man-Lyun, Lee, Ju-Il, Kang, Chang-Yong, Lee, Byoung-Hun, Jammy, Raj, Lee, Hi-Deok

Journal:

Japanese Journal of Applied Physics

Year:

2011

Language:

english

File:

PDF, 114 KB

english, 2011

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